Remote Sensing and GIS for Site Characterization: Applications and Standards

Coperta unu
Vernon Singhroy, Douglas Daniel Nebert, Arnold Ivan Johnson
ASTM, 1996 - 177 pagini
Contains selected papers from the title international symposium, held in January 1994 in San Francisco, CA. Sections on remote sensing applications, geographic information system (GIS), site characterization, and standards detail the latest findings in areas such as digital elevation data; Landsat T

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Remote Sensing and GIS for Site Characterization: Applications and Standards
Vernon Singhroy,Douglas Daniel Nebert,Arnold Ivan Johnson
Previzualizare limitată - 1996

Informații bibliografice

TitluRemote Sensing and GIS for Site Characterization: Applications and Standards
ASTM STP 1279
Volumul 1279 din ASTM special technical publication, ISSN 0066-0558
Volumul 1279 din ASTM special technical publication: American Society for Testing and Materials
Volumul 1279 din American Society for Testing and Materials: ASTM special technical publication
Journal of ASTM International: Selected technical papers
Online access: ASTM International ASTM Standards and Engineering Digital Library
Volumul 1279 din STP / ASTM
EditoriVernon Singhroy, Douglas Daniel Nebert, Arnold Ivan Johnson
Edițieilustrată
EditorASTM, 1996
ISBN0803120273, 9780803120273
Lungime177 pagini
  
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